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Month of February 2005

Showing 1 - 10 of 40943 results
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IPCOM000083127D 2005-Feb-28
The IBM Technical Disclosure Bulletin Vol. 15, No. 9, February 1973, at pages 2736 and 2737 describes an electrophotographic copying apparatus, whose document glass includes a grid pattern whose capacity changes when a conductive document is placed thereon. Information which is not to be copied is recorded on this...
IPCOM000083126D 2005-Feb-28
Disclosed is a method that integrates commercially available electrostatic discharge (ESD) monitors and statistical process controls (SPC) with wireless technology (e.g. WiFi, Bluetooth). Benefits include being able to easily implement real-time ESD monitors within a production facility without the need to lay out...
IPCOM000083125D 2005-Feb-28
This device, which may be hand-held, enables one to rapidly and accurately measure the diameter of a laser beam, and to investigate its intensity profile.
IPCOM000083124D 2005-Feb-28
Disclosed is a method for a substrate with a recessed pad. Benefits include improved functionality, improved reliability, improved throughput, and improved yield.
IPCOM000083123D 2005-Feb-28
The system, as depicted herein, describes a reel-to-reel control system with control loops for enabling low-speed operation (i.e., speed below 20 RPM of the DC motors. DC motors generally operate at speeds of 100 to 5,000 RPM. At speeds below 20 RPM, DC motors are susceptible to speed variations resulting from...
IPCOM000083122D 2005-Feb-28
Disclosed is a method for a tape-automated-bonding stacked chip scale package (TAB-SCSP). Benefits include improved functionality and improved performance.
IPCOM000083121D 2005-Feb-28
Common memory apparatus shared by a plurality of host CPU's, each host having an independent set of virtual address spaces, require memory-actuated operations on real disk type memory devices supporting the independent virtual addressing. Each host has independently operating chains of commands for effecting a...
IPCOM000083120D 2005-Feb-28
Disclosed is a method for wafer-level underfill for copper bump technology. Benefits include improved functionality, reliability, design flexibility, throughput time, and process simplicity.
IPCOM000083119D 2005-Feb-28
Disclosed is a method for a through silicon via interconnect application on wirebond (WB) silicon. Benefits include improved functionality, improved performance, and improved design flexibility.
IPCOM000083118D 2005-Feb-28
Satisfactory firmware (microcode) and hardware performances are checked for proper operation by program address monitoring. The program address monitoring checks to see whether or not a specific instruction stored in memory is executed within a specified length of time. In this mode, the processor check simply...
Showing 1 - 10 of 40943 results
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